Journal Contributions: Published
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N. Abe, M. Kudo, J. Toyama. Classifier-independent feature selection on the basis of divergence criterion. Pattern Analysis and Applications 9 (2006) 127-137 |
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R. Baumgartner, R.L. Somorjai. Data complexity assessment in undersampled classification. Pattern Recognition Letters 27 (2006) 1383-1389 |
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D. Elizondo. The Linear Separability Problem:. IEEE TRANSACTIONS ON NEURAL NETWORKS 17:2 (2006) 330-344 |
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2005 |
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Y. Li, M. Dong, R. Kothari. Classifiability-Based Omnivariate Decision Trees. IEEE Transactions on Neural Netwroks 16:6 (2005) 1547-1560 |
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2004 |
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S.N. Attoor, E.R. Dougherty. Classifier performance as a function of distributional complexity. Pattern Recognition 37:8 (2004) 1641-1651 |
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2003 |
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M. Dong, R. Kothari. Feature subset selection using a new definition of classificabilty. Pattern Recognition Letters 24 (2003) 1215-1225 |
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S. Singh. Multiresolution Estimates of Classification Complexity. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE 25:12 (2003) 1534-1539 |
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2002 |
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T.K. Ho, M. Basu. Complexity Measures of Supervised Classification Problems. IEEE Transactions on Pattern Analysis and Machine Intelligence 24:3 (2002) 289-300 |
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T.K. Ho. A Data Complexity Analysis of Comparative Advantages of Decision Forest Constructors. Pattern Analysis and Applications 5 (2002) 102-112 |
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Contributions to Books Chapters
Jump to Year: 2006
Conference Contributions
Jump to Year: 2006 2005 2004 2002 2000 1999
2006 |
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E. Pranckeviciene, T.K. Ho, R. Somorjai. Class Separability in Spaces Reduced By Feature Selection. The 18th International Conference on Pattern Recognition (ICPR'06). (2006) 254-257 |
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2005 |
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E. Hernandez, J.A. Carrasco, J.F. Martinez. Classifier Selection Based on Data Complexity Measures. X Congreso Iberoamericano de Reconocimiento de Patrones (CIARP 2005). Lecture Notes in Computer Science 3773, Springer 2005 (2005) 586-592 |
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2004 |
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R.P.W. Duin, E. Pekalska, D.M.J. Tax. The characterization of classification problems by classifier disagreements. Proceedings of the 17th International Conference on Pattern Recognition (ICPR'04). (2004) 141-143 |
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2002 |
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A.K. Jain, X. Xu, T.K. Ho, F. Xiao. Uniformity Testing Using Minimal Spanning Tree. XVI International Conference on Pattern Recognition (ICPR). Quebec City (Canada, 2002) 281-284 |
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2000 |
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T.K. Ho, M. Basu. Measuring the Complexity of Classification Problems. XV International Conference on Pattern Recognition (ICPR). Barcelona (Spain, 2000) 43-47 |
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1999 |
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M. Basu, T.K. Ho. The Learning Behavior of Single Neuron Classifiers on Linearly Separable or Nonseparable Input. International Joint Conference on Neural Networks. Washington DC (USA, 1999) 0-0 |
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